Abstract

Failures in reactive embedded systems are often unacceptable. In this thesis, the author describes the test suite generation and reduction technique in detail and present the results of the case studies.

Year Manuscript Completed

2014

Additional Categories

Computer Science (0984)

Keywords

Embedded computer systems Testing; Embedded computer systems Reliability; Computer software Testing; Computer software Quality control; Computer software Reliability.

Primary Language of Manuscript

EN

01Front.pdf (55 kB)

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